We have generalized the principle of resonant X-ray beam coupling to waveguides containing multiple guiding layers and characterized their X-ray optical properties. In such a device, several coherent beams of a width on the order of 10-100 nm can be extracted at the end of the waveguide. By measuring the farfield pattern formed by the interference of the beams, we demonstrate the possibility of using these devices as new tools to tailor the field distribution in the near- and far-field region for specific applications. Besides coherent diffraction and imaging, interferometry with two or more nanometer sized beams can be envisioned