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conference paper
Self-Heating Characterization and Extraction Method for Thermal Resistance and Capacitance in High Voltage MOSFETs
2003
ESSDERC '03. 33rd Conference on European Solid-State Device Research
Type
conference paper
Web of Science ID
WOS:000189004800109
Authors
Publication date
2003
Published in
ESSDERC '03. 33rd Conference on European Solid-State Device Research
Start page
449
End page
452
Peer reviewed
NON-REVIEWED
EPFL units
Available on Infoscience
October 10, 2007
Use this identifier to reference this record