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conference paper
Bias-dependent drift resistance modeling for accurate DC and AC simulation of asymmetric HV-MOSFET
2002
International Conference on Simulation of Semiconductor Processes and Devices
Type
conference paper
Web of Science ID
WOS:000180780700050
Authors
Publication date
2002
Published in
International Conference on Simulation of Semiconductor Processes and Devices
Start page
203
End page
206
Peer reviewed
NON-REVIEWED
EPFL units
Event name |
Available on Infoscience
October 10, 2007
Use this identifier to reference this record