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conference paper
Universal Test Structure and Characterization Method for Bias-Dependent Drift Series Resistance of HV MOSFETs
2002
32nd European Solid-State Device Research Conference
Type
conference paper
Authors
Publication date
2002
Published in
32nd European Solid-State Device Research Conference
Start page
247
End page
250
Peer reviewed
NON-REVIEWED
EPFL units
Event name |
Available on Infoscience
October 10, 2007
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