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research article
Modeling of drain current overshoot and recombination lifetime extraction in floating-body submicron SOI MOSFETs
Type
research article
Web of Science ID
WOS:000176532900015
Authors
Publication date
2002
Published in
Volume
49
Issue
7
Start page
1198
End page
1205
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
October 10, 2007
Use this identifier to reference this record