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Modeling of drain current overshoot and recombination lifetime extraction in floating-body submicron SOI MOSFETs

Munteanu, D. ; Ionescu, A. M.

Published in:
IEEE Transactions on Electron Devices (TED), 49, 7, 1198-1205
Year:
2002
Other identifiers:
DAR: 441
View record in Web of Science
Laboratories:
NANOLAB

Record appears in:
Scientific production and competences > STI - School of Engineering > IEL - Institute of Electrical Engineering > NANOLAB - Nanoelectronic Devices Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published



 Record created 2007-10-10, last modified 2018-03-17


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