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  4. Cathodoluminescence study of the spatial distribution of electron-hole pairs generated by an electron beam in Al0.4Ga0.6As
 
research article

Cathodoluminescence study of the spatial distribution of electron-hole pairs generated by an electron beam in Al0.4Ga0.6As

Bonard, J. M.
•
Ganiere, J. D.  
•
Akamatsu, B.
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1996
Journal of Applied Physics

We use the cathodoluminescence mode of a scanning electron microscope to investigate the depth and lateral dependencies of the electron-hole pairs generation by the electron beam in Al0.4Ga0.6As semiconducting material. A multiquantum well structure acts as a detector to measure the relative number of generated minority carriers by their radiative recombination, allowing a direct assessment of the generation volume in the sample. In contrast to electron-beam induced current which was used in former studies, the method avoids the effect of carrier diffusion for direct band gap materials. This novel technique can be readily applied to other III-V and II-VI semiconductors. The results may be used for the quantitative interpretation of cathodoluminescence and electron-beam induced current measurements. (C) 1996 American Institute of Physics.

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Type
research article
DOI
10.1063/1.362560
Web of Science ID

WOS:A1996UN85200089

Author(s)
Bonard, J. M.
Ganiere, J. D.  
Akamatsu, B.
Araujo, D.
Reinhart, F. K.
Date Issued

1996

Published in
Journal of Applied Physics
Volume

79

Issue

11

Start page

8693

End page

8703

Subjects

ENERGY LOSS DISTRIBUTION

•

DIFFUSION

•

PENETRATION

•

COLLECTION

•

GAASP

•

SEM

Note

France telecom,ctr natl etud telecommun,bagneux lab,f-92225 bagneux,france. Bonard, JM, ECOLE POLYTECH FED LAUSANNE,INST MICRO & OPTOELECTR,CH-1015 LAUSANNE,SWITZERLAND.

ISI Document Delivery No.: UN852

Cited Reference Count: 23

Cited References:

AKAMATSU B, 1989, J MICROSC SPECTROSC, V14, A12

ARAUJO D, 1994, MAT SCI ENG B-SOLID, V24, P124

COHN A, 1970, J APPL PHYS, V41, P3767

DONOLATO C, 1981, PHYS STATUS SOLIDI A, V65, P649

DONOLATO C, 1982, SOLID ST ELECTRON, V25, P1077

DONOLATO C, 1994, J APPL PHYS, V76, P959

EVERHART TE, 1971, J APPL PHYS, V42, P5837

FITTING HJ, 1977, PHYS STATUS SOLIDI A, V43, P185

GRUN AE, 1957, Z NATURFORSCH A, V12, P89

HOLT DB, 1994, SCANNING, V16, P78

HUBER AM, 1983, J PHYS-PARIS, V44, P409

KLEIN CA, 1968, J APPL PHYS, V39, P2029

KONNIKOV SG, 1988, SOV PHYS SEMICOND, V21, P1229

LEAMY HJ, 1982, J APPL PHYS, V53, R51

LUKE KL, 1985, J APPL PHYS, V57, P1978

LUKE KL, 1994, J APPL PHYS, V75, P1623

OELGART G, 1983, PHYS STATUS SOLIDI A, V75, P547

OELGART G, 1984, PHYS STATUS SOLIDI A, V85, P205

SIEBER B, 1994, MAT SCI ENG B-SOLID, V24, P35

WERNER U, 1988, J PHYS D, V21, P116

WITTRY DB, 1965, J APPL PHYS, V36, P1387

WU CJ, 1978, J APPL PHYS, V49, P2827

YACOBI BG, 1990, CATHODOLUMINESCENCE

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REVIEWED

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Available on Infoscience
August 31, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/11196
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