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Journal article

High-Reflectance Gainp/Gaas Distributed-Bragg-Reflector

A high-reflectance GaInP/GaAs distributed Bragg reflector (DBR) was grown by chemical beam epitaxy (CBE). The mirror consists of 40 pairs of alternating layers and was designed for a centre wavelength of 980 nm, resulting in a total thickness of 5.8 mum. Highly stable growth conditions led to a maximum reflectance of 0.99 and to a variation in the centre wavelength of only 5 nm over the 2'' (50.8 mm) wafer. Transmission electron microscopy and X-ray diffraction measurements confirmed the vertical uniformity and the crystallographic quality of the sample.

    Keywords: DISTRIBUTED BRAGG REFLECTOR LASERS ; SEMICONDUCTOR LASERS ; SURFACE-EMITTING LASERS

    Note:

    Saintcricq, b, ecole polytech fed lausanne,inst micro & optoelectr,ch-1015 lausanne,switzerland.

    ISI Document Delivery No.: NE967

    Times Cited: 6

    Cited Reference Count: 10

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    Reference

    Record created on 2007-08-31, modified on 2016-08-08

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