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conference paper
An Analytical Thermal Noise Model of MOS Transistor Valid in All Modes Of Operation
2005
NOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations; ICNF 2005
Type
conference paper
Web of Science ID
WOS:000232217300170
Authors
Publication date
2005
Published in
NOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations; ICNF 2005
ISBN of the book
0-7354-0267-1
Series title/Series vol.
AIP Proceedings; 780
Start page
741
End page
744
Peer reviewed
REVIEWED
Event name | Event place | Event date |
Salamanca, Spain | 19-23 September 2005 | |
Available on Infoscience
May 16, 2007
Use this identifier to reference this record