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research article

Comparison between nucleation of pentacene monolayer islands on polymeric and inorganic substrates

Pratontep, S.
•
Nüesch, F.  
•
Zuppiroli, L.  
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2005
Physical Review B (Condensed Matter and Materials Physics)

We present a comparative study of the nucleation and growth of pentacene monolayer islands in the submonolayer regime onto inorganic substrates of SiO2 and sapphire (Al2O3) and organic substrates of poly(methyl-metacrylate) (PMMA). We have determined the scaling laws that govern the saturated nucleation density per unit area N as a function of two essential deposition parameters: the deposition rate κ and the substrate temperature Ts. For all substrates, we found N∝κδ, with 0.8⩽δ⩽1.2, and the Ts dependence of the nucleation density follows a typical activated Arrhenius law. Whereas a critical nucleus size of i=2 is obtained for all investigated substrates, the activation energy for nucleation depends significantly on the dielectric. The difference in activation energy of nucleation on PMMA and SiO2 is due to different molecule-substrate interactions

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Type
research article
DOI
10.1103/PhysRevB.72.085211
Web of Science ID

WOS:000231564600070

Author(s)
Pratontep, S.
Nüesch, F.  
Zuppiroli, L.  
Brinkmann, M.
Date Issued

2005

Published in
Physical Review B (Condensed Matter and Materials Physics)
Volume

72

Issue

8

Article Number

85211

Subjects

dielectric materials

•

island structure

•

monolayers

•

nucleation

•

organic semiconductors

•

polymers

•

sapphire

•

semiconductor growth

•

silicon compounds

•

substrates

•

polymer substrates

•

pentacene monolayer islands growth

•

saturated nucleation density

•

inorganic substrates

•

submonolayer regime

•

sapphire substrates

•

poly(methyl-metacrylate)

•

scaling laws

•

deposition parameter

•

deposition rate

•

substrate temperature

•

Arrhenius law

•

critical nucleus size

•

activation energy

•

dielectric material

•

molecule-substrate interactions

•

SiO2

•

Al2O3

Note

Inst. Charles Sadron, Strasbourg, France

8602909

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LOMM  
Available on Infoscience
April 3, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/4258
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