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  4. Crossover from capacitive to pseudoinductive charge-relaxation in organic/polymeric light-emitting diodes
 
research article

Crossover from capacitive to pseudoinductive charge-relaxation in organic/polymeric light-emitting diodes

Castro, F. A.
•
Bueno, P. R.
•
Graeff, C. F. O.
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2005
Applied Physics Letters

In this work we propose a phenomenological microscopic approach to deal with pseudoinductive charge-relaxation processes (named also as negative capacitance phenomena) in organic molecules (tris-8-hydroxyquinoline-aluminum) and polymeric [poly(2-metoxy-5-(2'-etil-hexiloxy)-1,4-phenylene vinylene)] light-emitting diodes (OLEDs and PLEDs, respectively). The approach is based mainly on the fact that the recombination rate is higher than the slower carrier transit time to reach the recombination zone. The approach is supported by the fact that in both PLEDs and OLEDs, the strong pseudoinductive relaxation process was mainly observed when electron-hole recombination takes place, suggesting this is a recombination dependent phenomenon. Besides, the negative branch, in the real part of the complex capacitance representation as a function of the frequency, was not observed in PLED homopolar devices

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Type
research article
DOI
10.1063/1.1993770
Web of Science ID

WOS:000230277900058

Author(s)
Castro, F. A.
Bueno, P. R.
Graeff, C. F. O.
Nüesch, F.  
Zuppiroli, L.  
Santos, L. F.
Faria, R. M.
Date Issued

2005

Publisher

AIP

Published in
Applied Physics Letters
Volume

87

Issue

1

Article Number

13505

Subjects

capacitance

•

electron-hole recombination

•

organic light emitting diodes

•

organic semiconductors

•

polymers

•

polymeric light emitting diodes

•

Dept. de Fisica, Univ. de Sao Paulo, Brazil

•

organic light emitting diodes

•

pseudoinductive charge-relaxation

•

capacitive charge-relaxation

•

negative capacitance phenomena

•

tris-8-hydroxyquinoline-aluminum

•

poly2-metoxy-5-(2'-etil-hexiloxy)-1,4-phenylene vinylene

•

recombination rate

•

carrier transit time

•

recombination zone

•

electron-hole recombination

•

complex capacitance representation

Note

Copyright 2005, IEE

8574227

Editorial or Peer reviewed

REVIEWED

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April 3, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/4252
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