Conference paper

3d X-Y scaling of the resistivity and the effect of disorder in YBa2Cu3O7-δ thin films

We present measurements for the resistivity of `c' axis oriented YBa2Cu3O7-δ (YBCO) films grown on (100) SrTiO3 substrates by both laser ablation and ion beam sputtering. The effect of the magnetic field on the resistivity is investigated with the field parallel to the ` c' axis. The zero field transition widths vary from 1 K to 4 K in different films. However the data exhibits 3d X-Y critical scaling having introduced an `effective' magnetic field characteristic of the length scale of the disorder in the film


    • LPRX-CONF-2007-002

    Record created on 2007-03-09, modified on 2016-08-08


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