Bismuth Hall Sensors on Plastic Cantilevers

• Presented at: Nanofair 2003, St-Gallen, Switzerland, 09-11 Sept, 2003
• Publication date: 2003

Innovative surface imaging techniques allowing parallel magnetic and topographical microscopy with nanometer scale spatial resolution are developed in this project. Nanometer scale magnetosensitive devices on Atomic Force Microscopy (AFM) tips will be studied and fabricated, allowing quantitative and noninvasive magnetic field imaging with spatial resolution better than 100 nm and magnetic field resolution better than 100 mT/Hz. Such performance will allow one to perform magnetic microscopy studies, which are impossible with present magnetic imaging techniques. Magnetic imaging with spatial resolution better than 100 nm is currently performed by magnetic force microscopy (MFM). However, the MFM technique has three major drawbacks: it is hardly quantitative, invasive, and not fully "decoupled" from the AFM topography. The approach proposed in this project allows quantitative, more sensitive and non-invasive magnetic field measurements. Additionally, totally "decoupled" parallel AFM imaging is possible.

Reference

• LMIS1-POSTER-2007-024

Record created on 2007-03-02, modified on 2017-05-10