Focused electron beam induced deposition of high resolution magnetic scanning probe tips
2002
Details
Title
Focused electron beam induced deposition of high resolution magnetic scanning probe tips
Author(s)
Utke, I ; Cicoira, F ; Jaenchen, G ; Hoffmann, P ; Scandella, L ; Dwir, B ; Kapon, E ; Laub, D ; Buffat, PA ; Xanthopoulos, N ; Mathieu, HJ
Published in
Maerials. Research Society Symposium Proceedings
Volume
706
Pages
Z9.24.1-Z9.24.6
Date
2002
Keywords
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LOA - Advanced Photonics Laboratory
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15