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  4. PEELS Imaging and Linescan Study of Concentration Anisotropies in AlxGa1-xAs and InyGa1-yAs Heterostructures Grown on Non-Planar Substrates
 
conference paper

PEELS Imaging and Linescan Study of Concentration Anisotropies in AlxGa1-xAs and InyGa1-yAs Heterostructures Grown on Non-Planar Substrates

Leifer, K  
•
Rudra, A.  
•
Biasiol, G.
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1999
Microscopy of Semiconducting Materials
  • Details
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Type
conference paper
Web of Science ID

WOS:000166835300005

Author(s)
Leifer, K  
Rudra, A.  
Biasiol, G.
Michler, H.
Blank, E.
Buffat, P.A.  
Kapon, E.
Date Issued

1999

Published in
Microscopy of Semiconducting Materials
Series title/Series vol.

Institute of Physics Conference Series; 164

Start page

27

End page

30

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2986
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