Contrast analysis in TEM images of InGaAs/GaAs strained layers grown on non-planar substrates


Published in:
Microscopy of Semiconducting Materials. Proc., 164, 185-188
Year:
1999
Publisher:
IOP Publishing LTD
Other identifiers:
Laboratories:




 Record created 2007-02-15, last modified 2018-03-17


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