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conference paper
A method to determine the temperature dependence of the thickness of ferroelectric domain wall using weak beam transmisssion electron microscopy
1998
Résumés 2ème Congrès Trinoculaire des Microscopies
Type
conference paper
Authors
Publication date
1998
Published in
Résumés 2ème Congrès Trinoculaire des Microscopies
Volume
1/1
Start page
98
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
February 15, 2007
Use this identifier to reference this record