conference paper
A method to determine the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
1998
Proceedings Int. Conf. Electron Microscopy ICEM 14
Type
conference paper
Author(s)
Date Issued
1998
Published in
Proceedings Int. Conf. Electron Microscopy ICEM 14
Volume
2
Start page
585
End page
586
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
February 15, 2007
Use this identifier to reference this record