Quantitative determination on the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
1999
Details
Title
Quantitative determination on the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
Author(s)
Foeth, M ; Stadelmann, PA ; Buffat, PA
Published in
Ultramicroscopy
Volume
75
Issue
4
Pages
203-213
Conference
In-Situ Electron Microscopy, January 7-10 1999
Date
1999
Publisher
ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Other identifier(s)
View record in Web of Science
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15