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  4. Quantitative determination on the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
 
conference paper

Quantitative determination on the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy

Foeth, M
•
Stadelmann, PA  
•
Buffat, PA  
1999
Ultramicroscopy
In-Situ Electron Microscopy
  • Details
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Type
conference paper
DOI
10.1016/S0304-3991(98)00060-6
Web of Science ID

WOS:000077936900002

Author(s)
Foeth, M
Stadelmann, PA  
Buffat, PA  
Date Issued

1999

Publisher

ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS

Published in
Ultramicroscopy
Volume

75

Issue

4

Start page

203

End page

213

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Event nameEvent date
In-Situ Electron Microscopy

January 7-10 1999

Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2928
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