conference paper
A comparison of HREM and Weak Beam Transmission Electron Microscopy for the quantitative measurement of the thickness of ferroelectric domain walls
1998
Proceedings of the 2nd Japanese-Swiss Joint Seminar on Electron Microscopies in Material Sciences
Type
conference paper
Author(s)
Date Issued
1998
Published in
Proceedings of the 2nd Japanese-Swiss Joint Seminar on Electron Microscopies in Material Sciences
Volume
JOURNAL OF ELECTRON MICROSCOPY 48 (6) 1999
Start page
717
End page
723
Note
chercher
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
February 15, 2007
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