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  4. Quantitative Analysis of Al1-xGaxAs heterostructures using EELS
 
conference paper

Quantitative Analysis of Al1-xGaxAs heterostructures using EELS

Leifer, K  
•
Buffat, PA  
1997
Microscopy of Semiconducting Materials 1997
Royal-Microscopical-Society Conference on Microscopy of Semiconducting Materials Location
  • Details
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Type
conference paper
Web of Science ID

WOS:000071954600076

Author(s)
Leifer, K  
Buffat, PA  
Date Issued

1997

Published in
Microscopy of Semiconducting Materials 1997
ISBN of the book

0-7503-0464-2

Series title/Series vol.

Institute of Physics Conference Series; 157

Start page

381

End page

384

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Event nameEvent placeEvent date
Royal-Microscopical-Society Conference on Microscopy of Semiconducting Materials Location

OXFORD, ENGLAND

APR 07-10, 1997

Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2895
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