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Structural and morphological characterization of Nb2O5 thin film deposited by reactive sputtering

Rosenfeld, D ; Sanjines, R ; Lévy, F ; Buffat, PA[...]

Published in:
Journal Vac Science Tecnics, A12, 135-139
Year:
1994
Note:
chercher
Other identifiers:
View record in Web of Science
Laboratories:
CIME

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published



 Record created 2007-02-15, last modified 2018-03-17


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