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  4. Microstructural characterization of Ni/Ti multilayers with TEM, EDS and PEELS
 
conference paper

Microstructural characterization of Ni/Ti multilayers with TEM, EDS and PEELS

Leifer, K  
•
Buffat, PA  
•
Böni, P
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1994
ICEM
  • Details
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Type
conference paper
Web of Science ID

WOS:A1994BE09Y00091

Author(s)
Leifer, K  
Buffat, PA  
Böni, P
Elsenhans, O
Friedli, HP
Grimmer, H
Anderson, IS
Date Issued

1994

Published in
ICEM
Start page

189

End page

190

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2819
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