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research article
Characterization of short-period Si/sub m/Ge/sub n/ superlattices by high-resolution transmission electron microscopy and X-ray diffraction
1992
Type
research article
Authors
Publication date
1992
Published in
Volume
222
Issue
1-2
Start page
221
End page
6
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
February 15, 2007
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