A TEM study of the structure in PtSi ultrathin layers obtained on Si(100) by Pt sputtering and annealing


Published in:
surface science, 251-252, 150-154
Year:
1991
Laboratories:




 Record created 2007-02-15, last modified 2018-03-17


Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)