Home > Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction
 

Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction

Jager, W ; Leifer, K ; Ehrhart, P ; Kasper, E[...]

Published in:
Silicon Molecular Beam Epitaxy Symposium., 220, 167-73
Year:
1991
Publisher:
Mater. Res. Soc
Laboratories:
CIME

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published



 Record created 2007-02-15, last modified 2018-03-17


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