Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction


Published in:
Silicon Molecular Beam Epitaxy Symposium., 220, 167-73
Year:
1991
Publisher:
Mater. Res. Soc
Laboratories:




 Record created 2007-02-15, last modified 2018-03-17


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