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  4. Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction
 
conference paper

Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction

Jager, W
•
Leifer, K  
•
Ehrhart, P
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1991
Silicon Molecular Beam Epitaxy Symposium.
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Type
conference paper
Author(s)
Jager, W
Leifer, K  
Ehrhart, P
Kasper, E
Kibbel, H
Date Issued

1991

Publisher

Mater. Res. Soc

Published in
Silicon Molecular Beam Epitaxy Symposium.
Volume

220

Start page

167

End page

73

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2735
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