Infoscience

Conference paper

Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction

Jager, W; Leifer, K; Ehrhart, P; Kasper, E; Kibbel, H
  • Published in: Silicon Molecular Beam Epitaxy Symposium., vol. 220, p. 167-73
  • Mater. Res. Soc, 1991

    Reference

    • CIME-CONF-1991-002

    Record created on 2007-02-15, modified on 2017-05-12

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