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Rapid preparation of cross-sectional TEM samples from electroplated copper

Dinan, TE ; Landolt, D ; Ruterana, P ; Buffat, PA

Published in:
Mat. res. soc. Symp. Proc., 199, 281-288
Year:
1990
Laboratories:
CIME

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published



 Record created 2007-02-15, last modified 2020-07-30


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