Electron microscopy study of GaInAs/InP and GaInAsP/InP multilayer heterostructures
1989
Details
Title
Electron microscopy study of GaInAs/InP and GaInAsP/InP multilayer heterostructures
Author(s)
Spycher, R ; Buffat, PA ; Stadelmann, PA ; Roentgen, P ; Heuberger, W ; Graf, V
Published in
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Series
Institute of Physics Conference Series, 100
Pages
299-304
Conference
Royal Microscopical Society Conference, Oxford University, 10-13 April 1989
Date
1989
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15