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  4. Electron microscopy study of GaInAs/InP and GaInAsP/InP multilayer heterostructures
 
conference paper

Electron microscopy study of GaInAs/InP and GaInAsP/InP multilayer heterostructures

Spycher, R
•
Buffat, PA  
•
Stadelmann, PA  
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1989
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Royal Microscopical Society Conference
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Type
conference paper
Author(s)
Spycher, R
Buffat, PA  
Stadelmann, PA  
Roentgen, P
Heuberger, W
Graf, V
Date Issued

1989

Published in
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Series title/Series vol.

Institute of Physics Conference Series; 100

Start page

299

End page

304

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Event nameEvent placeEvent date
Royal Microscopical Society Conference

Oxford University

10-13 April 1989

Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2689
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