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conference paper
Electron microscopy study of GaInAs/InP and GaInAsP/InP multilayer heterostructures
1989
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Type
conference paper
Authors
Publication date
1989
Published in
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Series title/Series vol.
Institute of Physics Conference Series; 100
Start page
299
End page
304
Peer reviewed
REVIEWED
EPFL units
Event name | Event place | Event date |
Oxford University | 10-13 April 1989 | |
Available on Infoscience
February 15, 2007
Use this identifier to reference this record