High resolution observation and image simulation on cleaved wedges of III-V semiconductor
1988
Details
Title
High resolution observation and image simulation on cleaved wedges of III-V semiconductor
Author(s)
Buffat, PA ; Ganière, JD ; Stadelmann, PA
Published in
MRS Proceedings
Volume
109
Pages
111-116
Conference
MRS Fall Meeting
Date
1988
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15