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  4. High resolution observation and image simulation on cleaved wedges of III-V semiconductor
 
conference paper

High resolution observation and image simulation on cleaved wedges of III-V semiconductor

Buffat, PA  
•
Ganière, JD
•
Stadelmann, PA  
1988
MRS Proceedings
MRS Fall Meeting
  • Details
  • Metrics
Type
conference paper
DOI
10.1557/PROC-139-111
Author(s)
Buffat, PA  
Ganière, JD
Stadelmann, PA  
Date Issued

1988

Published in
MRS Proceedings
Volume

109

Start page

111

End page

116

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Event name
MRS Fall Meeting
Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2646
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