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  4. Probenhalter für tieftemperatur - in situ - verformungsversuche in einem 200 kV - Durchstrahlungs-Rasterelektronenmikroskop
 
conference paper not in proceedings

Probenhalter für tieftemperatur - in situ - verformungsversuche in einem 200 kV - Durchstrahlungs-Rasterelektronenmikroskop

Gotthardt, R
•
Buffat, PA  
1979
Réunion de la Soc. Suisse de Phys.
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Type
conference paper not in proceedings
Author(s)
Gotthardt, R
Buffat, PA  
Date Issued

1979

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Event name
Réunion de la Soc. Suisse de Phys.
Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2571
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