Expériences de déformation à basse température dans un microscope électronique de 200 kV
1979
Details
Title
Expériences de déformation à basse température dans un microscope électronique de 200 kV
Author(s)
Gotthardt, R ; Buffat, PA
Published in
Coll. Soc. Franç. Microsc. Electron.
Volume
4
Pages
24a
Date
1979
Publisher
J. Microsc. Spectrosc. Electron.
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15