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  4. Low temperature "In Situ" deformation in a 200 kV scanning transmission Electron Microscope
 
research article

Low temperature "In Situ" deformation in a 200 kV scanning transmission Electron Microscope

Gotthardt, R
•
Guisolan, B
•
Buffat, PA  
1979
Journal de microscopie et de spectroscopie électroniques
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Type
research article
Web of Science ID

WOS:A1979HX41700008

Author(s)
Gotthardt, R
Guisolan, B
Buffat, PA  
Date Issued

1979

Published in
Journal de microscopie et de spectroscopie électroniques
Volume

4

Issue

5

Start page

587

End page

594

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Available on Infoscience
February 15, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/2568
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