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  4. Deep-ultraviolet–microelectromechanical systems stencils for high-throughput resistless patterning of mesoscopic structures
 
research article

Deep-ultraviolet–microelectromechanical systems stencils for high-throughput resistless patterning of mesoscopic structures

van den Boogaart, M A F  
•
Kim, G M  
•
Pellens, R
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2004
Virtual Journal of Biological Physics Research

We describe a combination of 100-mm wafer scale deep-ultraviolet (DUV) exposure and a microelectromechanical systems (MEMS) process to fabricate silicon nitride membranes with submicrometer apertures to be used as miniature shadow masks or nanostencils. Apertures down to a lateral resolution of 200 nm were made in a 500-nm-thick membrane by DUV exposure and dry plasma etching. The membranes were released by a combination of wet silicon etching using potassium hydroxide (KOH) and dry silicon etching using a plasma process. The millimeter-size stencils were used for single-step, local deposition of metal micro- and nano-patterns without the need for photoresist process steps. We have performed stencil deposition on full wafer scale for micro- and nano-patterns in a variety of metals (e.g. Al, Au, Ni, etc.). Dry under-etching of the nanowires resulted in free-standing cantilevered nanoelectromechanical systems (NEMS) structures with resonance frequencies in the megahertz range. The resistless method allows us to pattern micrometer and nanometer scale patterns in a single step without any further processing. It is promising for the surface processing of MEMS/NEMS devices having sensitive or fragile surfaces, such as biochips, organic polymer layers, and self-assembled monolayers.

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Type
research article
Web of Science ID

WOS:000226439800115

Author(s)
van den Boogaart, M A F  
Kim, G M  
Pellens, R
van den Heuvel, J P
Brugger, J  
Date Issued

2004

Published in
Virtual Journal of Biological Physics Research
Volume

8

Issue

12

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LMIS1  
Available on Infoscience
February 1, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/221811
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