Element-specific X-Ray detection of electron paramagnetic resonance in thin films of quantum bits
Element-specific magnetism accessible by synchrotron-based X-ray spectroscopy has proven to be valuable to study spin and orbital moments of transition metals and lanthanides in technologically relevant thin-film and monolayer samples. The access to coherent spin superposition states relevant for emergent quantum technologies remains, however, elusive with ordinary X-ray spectroscopy. Here, we approach the study of such quantum-coherent states via the X-ray detection of microwave-driven electron paramagnetic resonance, which involves much smaller signal levels than X-ray detected ferromagnetic resonance on classical magnets. We demonstrate the feasibility of this approach with thin films of phthalocyanine-based metal complexes containing copper or vanadium centers. We also identify X-ray specific phenomena that we relate to charge trapping of secondary electrons resulting from the decay of the X-ray excited core-hole state. Our findings pave the way toward the element-specific X-ray detection of coherent superposition states in monolayers of atomic and molecular spins on virtually arbitrary surfaces.
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Doll, A., Xu, Z., Romankov, V., Boero, G., Rusponi, S., Brune, H., Salman, Z., & Dreiser, J. (2024). Element-specific X-Ray detection of electron paramagnetic resonance in thin films of quantum bits. Nature Communications, 15(1), Article 10313. https://doi.org/10.1038/s41467-024-54586-3
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