Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Hybrid phase-change — Tunnel FET (PC-TFET) switch with subthreshold swing < 10mV/decade and sub-0.1 body factor: Digital and analog benchmarking
 
conference paper

Hybrid phase-change — Tunnel FET (PC-TFET) switch with subthreshold swing < 10mV/decade and sub-0.1 body factor: Digital and analog benchmarking

Casu, E.A.
•
Vitale, W.A.
•
Oliva, N.
Show more
2016
2016 IEEE International Electron Devices Meeting (IEDM)
2016 IEEE International Electron Devices Meeting (IEDM)

In this paper we report the first hybrid Phase-Change - Tunnel FET (PC-TFET) device configurations for achieving a deep sub-thermionic steep subthreshold swing at room temperature and subthreshold power savings. The proposed hybrid device feedbacks the steep transition of Metal-Insulator transition in a VO2 structure into Gate or Source configurations of strained silicon nanowire Tunnel FETs, to achieve a switching with lon/Ioff better that 5.5×106 and with a subthreshold swing of 4.0 mV/dec at 25 °C. We demonstrate that the principle of PC-TFET switching relates to an internal amplification resulting in a sub-unity body factor, m, which is reduced to values below 0.1 for a current range larger than 2-3 decades. We report a full experimental digital and analog benchmarking of the new device and compare it with Tunnel FETs and CMOS. Remarkably, the PC-TFET can achieve analog figures of merit like gm/Id breaking the 40 V-1 limit of MOSFETs. We demonstrate and report the first buffered oscillator cell for neuromorphic computing exploiting the gate configuration of PC-TFET.

  • Details
  • Metrics
Type
conference paper
DOI
10.1109/IEDM.2016.7838452
Author(s)
Casu, E.A.
Vitale, W.A.
Oliva, N.
Rosca, T.
Biswas, A.
Alper, C.
Krammer, A.
Luong, G.V.
Zhao, Q.T.
Mantl, S.
Show more
Date Issued

2016

Publisher

IEEE

Published in
2016 IEEE International Electron Devices Meeting (IEDM)
Start page

19.3.1

End page

19.3.4

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
CMI  
LESO-PB  
Event nameEvent placeEvent date
2016 IEEE International Electron Devices Meeting (IEDM)

San Francisco, CA, USA

3-7 December 2016

Available on Infoscience
February 28, 2017
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/134869
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés