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  4. A 20-bit dynamic range CMOS A/D converter for ionization chambers
 
conference paper

A 20-bit dynamic range CMOS A/D converter for ionization chambers

Venturini, Giuseppe
•
Anghinolfi, Francis
•
Dehning, Bernd
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2011
2011 7th Conference on Ph.D. Research in Microelectronics and Electronics
2011 7th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)

We present the design of a wide dynamic-range CMOS A/D interface circuit for ionization chambers, able to digitize input charge of both polarities over six decades, to operate in a radioactive environment, and foreseen working without calibration. The circuit is based on a current-to-frequency conversion, where the converting circuit reconfigures itself depending on the input level to provide an output code every 40 μs. Simulation results of its implementation in a 0.25 μm CMOS are presented, showing its operation over a 120dB dynamic range. The simulated circuit consumes less than 33 mW from a 2.5-V supply. © 2011 IEEE.

  • Details
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Type
conference paper
DOI
10.1109/PRIME.2011.5966233
Author(s)
Venturini, Giuseppe
Anghinolfi, Francis
Dehning, Bernd
Krummenacher, Francois  
Kayal, Maher  
Date Issued

2011

Publisher

IEEE

Published in
2011 7th Conference on Ph.D. Research in Microelectronics and Electronics
ISBN of the book

978-142449137-7

Start page

125

End page

128

Subjects

A/D converter

•

Dynamic range

•

Interface circuits

•

Radioactive environment

•

Simulation result

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
GR-KA  
Event nameEvent placeEvent date
2011 7th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)

Madonna di Campiglio, Italy

3-7 07 2011

Available on Infoscience
November 7, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/72307
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