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research article

Nanoindentation and birefringence measurements on fused silica specimen exposed to low-energy femtosecond pulses

Bellouard, Yves  
•
Colomb, Tristan  
•
Depeursinge, Christian  
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2006
Optics Express

Femtosecond laser pulses used in a regime below the ablation threshold have two noticeable effects on Fused Silica (a-SiO2): they locally increase the material refractive index and modify its HF etching selectivity. The nature of the structural changes induced by femtosecond laser pulses in fused silica is not fully understood. In this paper, we report on nanoindentation and birefringence measurements on fused silica exposed to low-energy femtosecond laser pulses. Our findings further back the hypothesis of localized densification effect even at low energy regime.

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Type
research article
DOI
10.1364/OE.14.008360
Web of Science ID

WOS:000240460100043

Author(s)
Bellouard, Yves  
Colomb, Tristan  
Depeursinge, Christian  
Dugan, Mark
Said, Ali A.
Bado, Philippe
Date Issued

2006

Published in
Optics Express
Volume

14

Issue

18

Start page

8360

End page

8366

Subjects

[MVD]

•

Integrated optics

•

Integrated optics devices

•

Optical devices

•

All-optical devices

•

Optical devices

•

Waveguides

•

Ultrafast optics

•

Ultrafast processes in condensed matter

•

including

•

Optical devices

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
GALATEA  
LOA  
Available on Infoscience
July 20, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/41581
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