New evidence for reconstruction at the Si(100)-SiO2 interface from analysis of ion scattering

conference paper

Bongiorno, A.

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Hybertsen, M. S.

2003

Physics of Semiconductors 2002 Proceedings of the 26th International Conference, Edinburgh, 29 July to 2 August 2002

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ion.pdf

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Main Document

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Accepted version

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openaccess

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N/A

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317.75 KB

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