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Efe, B. C., Padmanabhan, P., Zhang, C., Ximenes, A. R., Lee, M. J., & Charbon, E. (2026). Characterization of a 3-D stacked CMOS SPAD depth sensor in 45/22-nm technology. Optics Express, 34(7), 11630–11651. https://doi.org/10.1364/OE.583545

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