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conference paper

High-k Dielectrics for Use as ISFET Gate Oxides

van der Wal, P. D.  
•
Briand, D.  
•
Mondin, G.
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2004
IEEE Sensors 2004
  • Details
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Type
conference paper
DOI
10.1109/ICSENS.2004.1426257
Author(s)
van der Wal, P. D.  
Briand, D.  
Mondin, G.
Jenny, S.
Jeanneret, S.
Millon, C.
Roussel, H.
Dubourdieu, C.
de Rooij, N. F.  
Date Issued

2004

Published in
IEEE Sensors 2004
Volume

2

Start page

677

End page

680

Editorial or Peer reviewed

NON-REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39994
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