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  4. Atomic force and scanning tunneling microscopy study of current-voltage properties of TiB2 microcontacts
 
research article

Atomic force and scanning tunneling microscopy study of current-voltage properties of TiB2 microcontacts

Heuberger, M.
•
Dietler, G.  
•
Strumpler, R.
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1997
Journal of Applied Physics
  • Details
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Type
research article
DOI
10.1063/1.365896
Author(s)
Heuberger, M.
Dietler, G.  
Strumpler, R.
Rhyner, J.
Isberg, J.
Date Issued

1997

Published in
Journal of Applied Physics
Volume

82

Issue

3

Start page

1255

End page

1261

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPMV  
Available on Infoscience
June 20, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/9046
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