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  4. Development of Insulated Conductive Probes with Platinum Silicide Tips for Atomic Force Microscopy in Cell Biology
 
research article

Development of Insulated Conductive Probes with Platinum Silicide Tips for Atomic Force Microscopy in Cell Biology

Akiyama, T.  
•
Gullo, M.
•
de Rooij, N. F.  
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2004
Japanese Journal of Applied Physics

A microfabrication process of a multifunctional probe is introduced for atomic force microscopy and various electrochemical measurements on biological samples in buffer solution. The silicon nitride probes have a spring constant lower than 0.1 N/m and a conductive tip, which is tightly insulated except at the apex. The conductive core of the tip consists of PtxSi y and shows a typical radius of curvature of 15 nm. A simultaneous measurement of topography and electrical current on graphite in air was demonstrated.

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Type
research article
DOI
10.1143/JJAP.43.3865
Author(s)
Akiyama, T.  
Gullo, M.
de Rooij, N. F.  
Tonin, A.
Hidber, H.-R.
Frederix, P.
Engel, A.
Staufer, U.
Frederix, P.L.T.M.
Date Issued

2004

Published in
Japanese Journal of Applied Physics
Volume

43

Start page

3865

End page

3867

Note

313

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/38916
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