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Santschi, C., Przybylska, J., Guillaumee, M., Vazquez-Mena, O., Brugger, J., & Martin, O. J. F. (2009). Focused Ion Beam: A Versatile Technique for the Fabrication of Nano-Devices. Praktische Metallographie-Practical Metallography, 46(3), 154–156. https://infoscience.epfl.ch/handle/20.500.14299/66134

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