Highly Sensitive Cantilevers, with and without Magnetic Tip, for Magnetic Resonance Force Microscopy
In this paper we present the fabrication and characterization of highly sensitive cantilevers, with and without magnetic tip, used for magnetic resonance force microscopy experiments. The full wafer silicon batch microfabrication was successful and the achieved production yield was about 70%. Cantilevers have been characterized in vacuum, at room temperature, and revealed promising properties for MRFM applications. A cantilever of 500x10x0.34
Cite this item
Mouaziz, S., Dysli, A., Brugger, J., & Boero, G. (2007). Highly Sensitive Cantilevers, with and without Magnetic Tip, for Magnetic Resonance Force Microscopy. Digest of Technical Papers, 1537–1540. https://doi.org/10.1109/SENSOR.2007.4300438
Click Copy to copy the citation, or select the text manually.
Mouaziz_2007_Transducers01.pdf
restricted
253.73 KB
Adobe PDF
dcbae61b9cf06ae3458d67ffe4f40ca1