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  4. Failure Analysis of Micro-Heating Elements Suspended on Thin Membranes
 
conference paper

Failure Analysis of Micro-Heating Elements Suspended on Thin Membranes

Beaudoin, F.
•
Briand, D.  
•
Courbat, J.  
Show more
2005
Microelectronics Reliability
16th European Symposium Realibility of Electron Devices, Failure Physics and Analysis

We report on the degradation of platinum micro-heating elements operating at high temperatures. Devices with platinum heaters suspended on micro-machined dielectric membranes were self-heated at high temperature until failure. Optical and SEM observations combined with mechanical deformation measurements and Thermal Laser Stimulation techniques were used to analyze the failure mechanisms of the micro-heating elements. Platinum atoms migration and breaking of the membrane were two failure modes observed. At high temperature, the migration of the platinum atoms was linked to the mechanical stress in the dielectric membrane. The Thermal Laser Stimulation technique revealed the formation of vertical as well as lateral thermocouples at mechanically deformed areas. One explanation proposed is that those thermocouples are the result of Si diffusion from the Si3N4 membrane into the platinum heater as well as electro-stress migration of platinum atoms. © 2005 Elsevier Ltd. All rights reserved.

  • Details
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Type
conference paper
DOI
10.1016/j.microrel.2005.07.106
Author(s)
Beaudoin, F.
Briand, D.  
Courbat, J.  
de Rooij, N. F.  
Desplats, R.
Perdu, P.
Date Issued

2005

Published in
Microelectronics Reliability
Volume

45

Issue

9–11

Start page

1786

End page

1789

Note

349

Editorial or Peer reviewed

NON-REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Event name
16th European Symposium Realibility of Electron Devices, Failure Physics and Analysis
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/38980
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