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  4. Mapping the Local Youngs Modulus by Analysis of the Elastic Deformations Occurring in Atomic-Force Microscopy
 
research article

Mapping the Local Youngs Modulus by Analysis of the Elastic Deformations Occurring in Atomic-Force Microscopy

Heuberger, M.
•
Dietler, G.  
•
Schlapbach, L.
1995
Nanotechnology
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Type
research article
DOI
10.1088/0957-4484/6/1/003
Author(s)
Heuberger, M.
Dietler, G.  
Schlapbach, L.
Date Issued

1995

Published in
Nanotechnology
Volume

6

Issue

1

Start page

12

End page

23

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPMV  
Available on Infoscience
June 20, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/9040
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