conference paper
Coulomb blockade in gate-all-around silicon nanowire MOSFETs
2006
Proceedings of IEEE 2006 silicon nanoelectronics workshop, VLSI 2006 workshop
Type
conference paper
Author(s)
Date Issued
2006
Published in
Proceedings of IEEE 2006 silicon nanoelectronics workshop, VLSI 2006 workshop
Start page
25
End page
26
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
May 16, 2007
Use this identifier to reference this record