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  4. Effect of the Interface Resistance on the Extraordinary Magnetoresistance of Semiconductor/Metal Hybrid Structures
 
research article

Effect of the Interface Resistance on the Extraordinary Magnetoresistance of Semiconductor/Metal Hybrid Structures

Möller, C. H.
•
Grundler, D.
•
Kronenwerth, O.
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2003
Journal of Superconductivity

We report on magnetotransport experiments performed at 4.2 K on hybrid structures consisting of a metal and a mesoscopic two-dimensional electron system in an InAs/InGaAs heterostructure. The devices were fabricated using cleaved-edge overgrowth. We find that they exhibit an extraordinary magnetoresistance effect (EMR) which is most pronounced in the case of the lowest specific contact resistance ρ i of ≈10−8 Ω cm2 achieved in this work. The largest relative resistance change Δ R/R is 115,000% at a magnetic field B = 1 T. A systematic study of the performance of the EMR devices with down to sub-μm lateral dimension and with different ρ i is reported.

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Type
research article
DOI
10.1023/A:1023246431624
Author(s)
Möller, C. H.
Grundler, D.
Kronenwerth, O.
Heyn, C.
Heitmann, D.
Date Issued

2003

Publisher

Springer Verlag

Published in
Journal of Superconductivity
Volume

16

Issue

1

Start page

195

End page

199

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LMGN  
Available on Infoscience
July 8, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/116021
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