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Gelman, S., Rosenhek‐Goldian, I., Kampf, N., Patočka, M., Ríos-Ramírez, M., Penedo, M., Fantner, G. E., Beker, A., Cohen, S., & Azuri, I. (2025). Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images. Beilstein Journal of Nanotechnology, 16, 1129–1140. https://doi.org/10.3762/bjnano.16.83

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